Atomic Force Microscopy (AFM)

The AFM extension for witec360 Raman microscopes facilitates analysis of material surfaces at the nanometer scale. The integrated design allows for fast, seamless switching between AFM and other measurement modes, while also supporting simultaneous Raman-AFM measurements. With its combined approach, witec360 ensures precise optical alignment and enables convenient correlative imaging of the same sample area for comprehensive analyses in materials science, polymer research, nanotechnology, and life sciences.

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Key Features

Easy combination of comprehensive surface characterization (AFM) and molecular information (Raman) in one system
Wide range of AFM modes for topographic, stiffness and adhesion investigations
High resolution capabilities: Lateral resolution down to 1nm; depth resolution <0.3 nm
Seamless combination with other correlative imaging techniques
Integrated measurement control and data analysis via the witec360’s Software Suite
Straight-forward navigation on the sample via high-quality video image
Easy exchange and alignment of premounted cantilevers
Precise sample positioning via TrueScan™ controlled piezo scan stages of selectable scan ranges
Microscope base with active vibration isolation system
Suitable for TERS applications

AFM topography image of a cat hair.

AFM Operation Modes

Contact Mode
AC Mode (Intermittent Mode, Phase Imaging)
Digital Pulsed Force Mode (DPFM)
Lift Mode™
Magnetic Force Microscopy (MFM)
Electrostatic Force Microscopy (EFM)
Force Distance Curves

Lithography and Nanomanipulation
Lateral Force Microscopy (LFM)
Chemical Force Microscopy (CFM)
Kelvin Probe Microscopy
Conductive Contact AFM
Piezoresponse Force Microscopy
Operation in Liquid Environments

Combined Raman-AFM measurement of the same sample area of a multicomponent polymer blend consisting of a 1:1:1 mixture of polystyrene, SBR (styrene-butadiene rubber) and EHA (2-ethylhexyl acrylate). Raman image (left): green = PS, red= SBR, blue = EHA.

The Principle

AFM measures surface topography and local material properties such as adhesion and stiffness by recording interaction forces between a sharp tip on a cantilever and the sample surface. The deflection of the cantilever is monitored as the sample is scanned with nanometer precision using a piezo-driven stage, enabling the generation of high-resolution images.

Application Examples

Correlative Raman-AFM microscopy of stress in silicon. Left: 10 μm x 10 μm AFM topography image and depth profile (bottom). Right: Corresponding Raman image revealing the stress areas in silicon. Sampe courtesy: Helmut Fischer GmbH, Sindelfingen, Germany.