2D materials such as carbon nano-tubes, graphene or transition metal dichalcogenides (TMDs) show immense promise in many applications such as transistors, sensors, and optoelectronics. Flexible and adaptive analytical methods can support effective investigation and accelerate progress in 2D materials research and development.
For comprehensive investigations of nano-carbon and TMD samples WITec microscopes can be equipped with various imaging techniques such as confocal Raman imaging, Atomic Force Microscopy (AFM), and Nearfield Microscopy (Scanning Nearfield Optical Microscopy, SNOM). In addition, all WITec imaging techniques can be fully integrated in a single microscope. For the comprehensive analysis and imaging of 2D materials, WITec also offers a wide range of imaging combinations including Raman-AFM, TERS, Nearfield- Raman, or Raman-SEM which provide enhanced imaging capabilities for groundbreaking research.