In archeological research, various specimens such as paintings, mummies, antique objects or fabrics are regularly investigated. Those samples are often unique and require specialized treatment when being analyzed. WITec imaging systems enable comprehensive sample analysis that provides a thorough understanding of the physical and chemical properties of archaeological samples. Confocal Raman imaging for example is a flexible, non-invasive and non-destructive tool for the chemical and molecular characterization of archaeological specimens. The samples typically do not require specific sample preparation and remain unaltered for further investigations with other methods.
WITec’s highly versatile instruments can combine various imaging techniques to significantly increase the insights provided by measurement results. Possible combinations which can be included in a single microscope setup include confocal Raman imaging, Atomic Force Microscopy (AFM), Nearfield-Microscopy (SNOM) and Scanning Electron Microscopy (SEM). Confocal Raman imaging provides chemical information, AFM detects topography, structure, and physical properties such as stiffness, adhesion, etc. of the sample’s surface, and SNOM high-resolution measurements can optically reach beyond the diffraction limit. All WITec instrument configurations can be upgraded at any point to adapt the system to new or extended requirements.