alpha300 A – AFM Microscope

Nanoscale Surface Characterization

The WITec alpha300 A atomic force microscope is a reliable, high-quality nano-imaging system integrated with a research-grade optical microscope and provides superior optical access, easy cantilever alignment and high-resolution sample survey.

WITec Atomic Force Microscopes are developed and designed to allow combination with other imaging techniques such as confocal Raman imaging. All imaging techniques can be integrated within the same microscope system. By simply rotating the microscope turret the user can then switch between the different methods. Possible combinations with AFM include luminescence, fluorescence, polarization analysis, bright field, dark field, SNOM, and Raman imaging.

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Key Features

Surface characterization on the nanometer scale
Lateral resolution: down to 1 nm
Depth resolution: < 0.3 nm
Wide range of AFM modes included
User-friendly sample access from any direction
Ease-of-use in air and liquids
Unique cantilever technique for convenient cantilever exchange and alignment
Precise TrueScan™ controlled scan stages with a selectable scan range
Non-destructive imaging technique with minimal, if any, sample preparation
Upgradeable with confocal Raman imaging and Nearfield-Microscopy (SNOM) in one microscope

Application Examples

AFM topography image of a fully developed sternal deposit from a woodlouse (P. scaber).

alpha300A magnetic force mode hard drive

Magnetic Force Measurement of PC Hard Drive. The measurements were performed using AC mode technique with magnetic tips.

Digital Pulsed Force Mode image of fossilized bacteria. The image shows the different adhesion levels of the sample surface.

Specifications

Operation Modes:

Contact Mode
AC Mode (Intermittent Mode, Phase Imaging)
Digital Pulsed Force Mode (DPFM)
Lift Mode™
Magnetic Force Microscopy (MFM)
Electrostatic Force Microscopy (EFM)
Force Distance Curves
Lithography and Nanomanipulation
Lateral Force Microscopy (LFM)
Chemical Force Microscopy (CFM)
Kelvin Probe Microscopy
others on request

Microscope Features:

Research grade optical microscope with 6 x objective turret
Video system: color video camera
LED white-light source for Köhler illumination of tip and sample
Manual sample or motorized positioning in x- and y-direction
Various piezo-driven scan stages, fully capacitive feedback-controlled
Microscope base with active vibration isolation system

AFM Cantilever:

Inertial drive cantilever mechanics for AFM sensors
Commercially available AFM cantilever can be used

Sensors:

AFM sensors, Acoustic AC mode type, with reflex coating, pre-mounted on magnetic rings
AFM sensors, contact mode type, with reflex coating, pre-mounted on magnetic rings
Commercially available sensors can be used

Computer Interface:

WITec software suite for instrument and measurement control, data evaluation and processing

Contact

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