Part of the Oxford Instruments Group

Scanning Probe Microscopes

The scanning probe microscopy solutions in the alpha300 line offer high resolution structural and optical characterization. Many well-established AFM modes can be integrated with both the alpha300 A atomic force microscope (AFM) and the alpha300 S scanning near-field optical microscope (SNOM). They also feature a research-grade white-light microscope for high resolution sample survey and the full range of alpha300 series sample handling options. The alpha300 S uses robust and convenient cantilever tips with apertures as SNOM sensors.