Correlative Microscopes

The modular design of WITec microscopes allows the combination of various imaging techniques such as Raman imaging, fluorescence, photoluminescence, atomic force microscopy (AFM), near-field microscopy (SNOM) and scanning electron microscopy (SEM) in one instrument for more comprehensive sample analysis. Switching between the different modes can be performed by simply rotating the microscope turret, or shuttling the sample between measuring positions in correlative SEM (RISE microscopy) systems.