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  4. Suite SEVEN – Measurement Control and Data Analysis

Suite SEVEN – Measurement Control and Data Analysis

Suite SEVEN – Measurement Control and Data Analysis

One integrated environment empowers scientists from setup through data acquisition and post-processing.

Suite SEVEN introduces capabilities that make the already powerful software even more transparent, intuitive and precise. Documentation, navigation, certification and processing features help researchers extract the best performance from their microscopes and the clearest insights from their data.


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New Features

  • DataTrace: Archives measurement and processing steps and features metadata viewer with time stamps and export parameters for reproducibility
  • Enhanced Project Manager: Provides tool bar with search, hierarchical data structure and selective display of data objects 
  • Spectral Certification*: Uses the spectrum of a reference sample to verify system calibration with standardized data. 
  • Advanced Cosmic Ray Removal**: Facilitates the detection, selection and removal of cosmic rays.

Key Features

  • TrueOrigin: Portable coordinate system: Locates the same sample area in different measurements and even different microscopes 
  • Workflow Manager*: Streamlines your optimized and standardized measurement workflows
  • State Manager: Defines and retrieves your standard microscope operation settings
  • Multi-user Management*: Defines access rights associated with each user account

* cost option ** Suite SEVEN+ feature

Explore the WITec Software Packages


Suite SEVEN

  • Instrument configuration and control
  • High-speed data acquisition
  • Data evaluation and processing

 

Find out more


Suite SEVEN+

  • All basic package features included
  • Advanced tools for data processing
  • TrueComponent Analysis

  

Find out more


Additional Software 

  • ParticleScout
  • TrueMatch
  • Multi-user Management
    Explore options

    The WITec Suite SEVEN basic software package

    The Suite SEVEN basic software modules offer you powerful platforms for instrument control and sophisticated data analysis.

    Instrument Control

    • One intuitive software package for all measurement modes
    • Optimized user interface depending on the measurement mode
    • User-customizable standard configurations for recurring measurements via the State Manager
    • High-speed data acquisition and processing through intelligent computer resource management (>1300 Raman spectra per second)
    • TrueScanTM for exact positioning even at the fastest scan rates
    • All features of the Project SEVEN package included for on- and offline data evaluation and post processing
    • TrueOrigin, WITec’s portable coordinate system that maps a sample in relation to prominent features on the specimen itself or its holder. It expedites the correlation of data acquired by multiple techniques from the same position, even when the sample is moved between instruments. Imported images recorded with an external camera or a different microscope can be used for sample navigation. TrueOrigin is compatible with the Shuttle & Find system from ZEISS.

    Data Evaluation and Processing

    • Accessing metadata of imaging settings and data analysis steps via DataTrace
    • Guidance through all steps of data processing and image generation (Software Wizard)
    • Graph Demixer: Subtraction or addition of spectra with adjustable weighting factors
    • Multiple algorithms for background subtraction and cosmic ray removal
    • Curve-fitting tool for single spectra, including: several pre-defined fit functions (such as Gaussian, Lorentzian and pseudo-Voigt functions), multiple peak fitting and programming of user-defined functions
    • Spectral peak finder and labeling
    • Import of external images for consistent project documentation
    • Data export to various formats, including ASCII, JCamp-DX, SPC, MATLAB, Zeiss CZI and HDF5
    • Included demo versions of all features of Project SEVEN+

    The Project SEVEN+ package: Advanced data analysis

    Project SEVEN+ is a software extension for advanced data evaluation and processing. A variety of intelligent algorithms and tools facilitate specialized, expert-level analysis and visualization. Project SEVEN+ is available as single user license. All SEVEN+ features are included as demo versions in Project SEVEN.

    Key features

    • Advanced Cosmic Ray Removal tool
    • Cluster analysis (automatic classification, average spectra generation and cluster visualization in images)
    • TrueComponent Analysis for Raman imaging: Advanced algorithm that automatically establishes the number of sample components, differentiates their spectra and locates them in the image
    • Principal component analysis (PCA)
    • Advanced curve fitting tool for fitting of multi-spectral datasets
    • Overlay of images recorded with different techniques
    • Various filters (e.g. Fourier, anisotropic, edge, sharpen, user-customized filters and many more)
    • Graph and image repair: data substitution algorithms such as interpolations or texture analysis for removing pixel failures
    • Non-negative matrix factorization (NMF)

    Optional software packages compatible with Suite SEVEN

    TrueMatch Raman spectral database management software

    TrueMatch Raman spectral database management software
    Identify measured spectra with established Raman libraries or create your own database.

    Find out more

    ParticleScout for Raman-based microparticle analysis

    ParticleScout for Raman-based microparticle analysis
    Find, classify, identify and quantify particulate sample components.

    Find out more

    Workflow Manager

    Workflow Manager
    Automate experimental sequences.

    Find out more

    Multi-user Management

    Multi-user Management
    Define functionalities and data access rights for individual user accounts.

    Find out more

    Programming Interface

    Programming Interface
    Implement user-defined measurement procedures

    Find out more

    Nanomanipulation and Nanolithography

    Nanomanipulation and Nanolithography
    Induce nanomanipulations with highest precision.

    Find out more

    Application Examples

    Correlative Raman-AFM study of a polymer blend

    Raman and AFM topography images of a PS-PMMA polymer blend
    Raman image (left) showing the phase separation in a blend of PMMA (red) and PS (blue) and AFM topography image (right) of the same sample area.
    Raman spectra of PMMA and PS
    Raman spectra of PMMA (red) and PS (blue).
    Overlay of AFM topography and Raman image of a PS-PMMA polymer blend
    Overlay of the AFM topography and Raman image, relating structural and chemical information.

    High-resolution Raman imaging of a pharmaceutical tablet

    Raman imaging of a pharmaceutical tablet
    Large-area, high-resolution Raman image of a painkiller tablet. The Raman image (left) is color-coded according to the Raman spectra (right) of the individual components, which were differentiated automatically with TrueComponent Analysis and identified using the TrueMatch spectral database software.

    RISE (Raman-SEM) imaging of a battery cathode

    RISE (Raman-SEM) image of a lithium ion battery cathode
    RISE image (overlay of Raman and SEM images) of a lithium-ion battery (LIB) cathode. LIB particles of different compositions (blue, green) are embedded in the carbon matrix (red).

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