Part of the Oxford Instruments Group

alpha300 A – AFM Microscope

Nanoscale Surface Characterization

The WITec alpha300 A atomic force microscope is a reliable, high-quality nano-imaging system integrated with a research-grade optical microscope and provides superior optical access, easy cantilever alignment and high-resolution sample survey.

WITec Atomic Force Microscopes are developed and designed to allow combination with other imaging techniques such as confocal Raman imaging. All imaging techniques can be integrated within the same microscope system. By simply rotating the microscope turret the user can then switch between the different methods. Possible combinations with AFM include luminescence, fluorescence, polarization analysis, bright field, dark field, SNOM, and Raman imaging.

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Key Features

Application Examples

alpha300A topography woodlouse
AFM topography image of a fully developed sternal deposit from a woodlouse (P. scaber).
alpha300A magnetic force mode hard drive
Magnetic Force Measurement of PC Hard Drive. The measurements were performed using AC mode technique with magnetic tips.
WITec AFM Bacteria
Digital Pulsed Force Mode image of fossilized bacteria. The image shows the different adhesion levels of the sample surface.


Operation Modes:

  • Contact Mode
  • AC Mode (Intermittent Mode, Phase Imaging)
  • Digital Pulsed Force Mode (DPFM)
  • Lift Mode™
  • Magnetic Force Microscopy (MFM)
  • Electrostatic Force Microscopy (EFM)
  • Force Distance Curves
  • Lithography and Nanomanipulation
  • Lateral Force Microscopy (LFM)
  • Chemical Force Microscopy (CFM)
  • Kelvin Probe Microscopy
  • others on request


Microscope Features:

  • Research grade optical microscope with 6 x objective turret
  • Video system: color video camera
  • LED white-light source for Köhler illumination of tip and sample
  • Manual sample or motorized positioning in x- and y-direction
  • Various piezo-driven scan stages, fully capacitive feedback-controlled
  • Microscope base with active vibration isolation system

AFM Cantilever:

  • Inertial drive cantilever mechanics for AFM sensors
  • Commercially available AFM cantilever can be used



  • AFM sensors, Acoustic AC mode type, with reflex coating, pre-mounted on magnetic rings
  • AFM sensors, contact mode type, with reflex coating, pre-mounted on magnetic rings
  • Commercially available sensors can be used


Computer Interface:


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