alpha300 RS – Raman-SNOM Microscope

Correlative Raman and Scanning Near-field Optical Microscopy

For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with Scanning Near-field Optical Microscopy for optical imaging with resolution beyond the diffraction limit. It combines all features of the alpha300 S and alpha300 R and many AFM operation modes. Furthermore the combined Raman-SNOM microscope is ideally suited for high-resolution Raman imaging techniques such as nearfield-Raman imaging.

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Key Features

All features of the alpha300 R (Raman) and the alpha300 S (SNOM) microscope provided in one instrument
Excellent combination of high-resolution surface imaging (SNOM) and chemical imaging (Raman)
Ideally suited for combined techniques such as near-field Raman imaging
Convenient switching between the measurement techniques is realized by a rotation of the objective turret
Sample movement between the measurements not necessary

Application Examples

Left: Topography image of exfoliated graphene simultaneously determined during the nearfield-Raman measurement with corresponding topography curve measured along the blue line. Right: Nearfield-Raman image of the same sample area of the G-band intensity with corresponding intensity graph measured along the red line.

Specifications

Raman General Operation Modes

Raman spectral imaging: acquisition of a complete Raman spectra at every image pixel
Planar (x-y-direction) and depth scans (z-direction) with manual sample positioning
Image stacks: 3D confocal Raman imaging
Time series
Single point Raman spectrum acquisition
Single-point depth profiling
Fibre-coupled UHTS spectrometer specifically designed for Raman microsopy and applications with low light intensities
Confocal Fluorescence Microscopy
Bright Field Microscopy

SNOM Operation Modes

Scanning Near-field Optical Microscopy (SNOM) modes: bottom up and top down mode, collection mode
Confocal Microscopy (CM) modes:
- Transmission
- Reflection
- Fluorescence (optional)
- SNOM-AFM combinations: AFM operation modes of alpha300 A included or optional available
- Acquisition of force-distance curves and light-distance curves
- Fixed-bottom illumination
- Total internal reflection illumination (optional)

AFM Operation Modes

Contact Mode
Lateral Force Mode
others optional

Basic Microscope Features

Research grade optical microscope with 6x objective turret
Video system: video CCD camera
High sensitivity b/w video camera to view sample and SNOM/AFM tip in transmission
LED white-light source for Köhler illumination of AFM tip and sample
Manual sample positioning in x- and y-direction
Microscope base with active vibration isolation system
Fibre coupling

Raman Optional/Upgradable Operation modes

Additional lasers, several wavelenghts eligible
Additional UHTS spectrometers (UV, VIS, NIR)
Automated, motorized sample positioning and measuring with piezo-driven scan stages
Automated confocal Raman imaging
Automated multi-area and multi-point measurements
Ultrafast Raman imaging (1300 spectra per second) optionally available
Upgradable for epi-fluorescence applications
Adapter for higher samples
TrueSurface for Raman depth profiling
Autofocus

Computer Interface

WITec software suite for instrument and measurement control, data evaluation and processing

Related Applications

Coatings & Thin Films Life Science Materials Science Nano-Carbon & 2D Materials Polymers Semiconductors & Photovoltaics

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